In time, the expansion of This system to an entire wafer, or better, the use of a large resolution X-ray diffraction imaging (XRDI) system, to provide a full 3D defect map from the Intelligent Cut layer will be valuable to establish the defect density around The complete wafer. On their https://www.facebook.com/permalink.php?story_fbid=pfbid0TQxdDrEw2QBDdBiTLRwtSVDMK67p7cEebAmUfcW2zdNWdKoBZhwWHts6KSR8v7fKl&id=61560512640678&__cft__[0]=AZV-rCLoERThtY9mnJfjmIyJ_y2vrCQcGCzMBhe0X-YZ2rYTaYb6_zv1aBK5hOZjfKhnxg8EJohxDLRmvRifez5kCDExFxgysqVKR870UCXbzMvmr0A2aoYqCealfXKKisrd-UtHdnq-V6tozfUXsMxepraMUv7S5Wk-RvxIiYvVH3uzz8zhj0ORJqXlYZmdKDhMcGl9u_g_iGSLkm5OyoRn&__tn__=%2CO%2CP-R